![You've spotted a flaw in a top journal's paper. Good luck getting your critique published | Science | AAAS You've spotted a flaw in a top journal's paper. Good luck getting your critique published | Science | AAAS](https://www.science.org/do/10.1126/science.ade7837/abs/_20220907_on_insider_postpubcritique.jpg)
You've spotted a flaw in a top journal's paper. Good luck getting your critique published | Science | AAAS
![Fault models and test generation for IDDQ testing | Proceedings of the 2000 Asia and South Pacific Design Automation Conference Fault models and test generation for IDDQ testing | Proceedings of the 2000 Asia and South Pacific Design Automation Conference](https://dl.acm.org/cms/asset/bc11e7a2-74a1-4978-92c9-05ccd37a217c/368434.368773.fp.png)
Fault models and test generation for IDDQ testing | Proceedings of the 2000 Asia and South Pacific Design Automation Conference
![SWiTEST: a switch level test generation system for CMOS combinational circuits | Proceedings of the 29th ACM/IEEE Design Automation Conference SWiTEST: a switch level test generation system for CMOS combinational circuits | Proceedings of the 29th ACM/IEEE Design Automation Conference](https://dl.acm.org/cms/asset/48bd56e3-0942-4890-869a-29f22a8b4ffd/113938.113931.fp.png)
SWiTEST: a switch level test generation system for CMOS combinational circuits | Proceedings of the 29th ACM/IEEE Design Automation Conference
![double sided - Add Copyright Footer in left column of a IEEE conference paper - TeX - LaTeX Stack Exchange double sided - Add Copyright Footer in left column of a IEEE conference paper - TeX - LaTeX Stack Exchange](https://i.stack.imgur.com/X6n5H.jpg)